Skip to main content
SpringerLink
Log in
Book cover

Design for AT-Speed Test, Diagnosis and Measurement

  • Book
  • © 2000

Overview

Editors:
  1. Benoit Nadeau-Dostie

    1. Logic Vision, Inc., USA

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Frontiers in Electronic Testing (FRET, volume 15)

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (8 chapters)

  1. Front Matter

    Pages i-xvii
    Download chapter PDF

  2. Technology Overview

    Pages 1-33

  3. Memory Test and Diagnosis

    Pages 35-57

  4. Logic Test and Diagnosis

    Pages 59-92

  5. Embedded Test Design Flow

    Pages 93-115

  6. Hierarchical Core Test

    Pages 117-137

  7. Test and Measurement for PLLs and ADCs

    Pages 139-169

  8. System Test and Diagnosis

    Pages 171-187

  9. System Reuse of Embedded Test

    Pages 189-216

  10. Back Matter

    Pages 217-239
    Download chapter PDF
Back to top

Keywords

About this book

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.

Editors and Affiliations

  • Logic Vision, Inc., USA

    Benoit Nadeau-Dostie

Bibliographic Information

  • Book Title: Design for AT-Speed Test, Diagnosis and Measurement

  • Editors: Benoit Nadeau-Dostie

  • Series Title: Frontiers in Electronic Testing

  • DOI: https://doi.org/10.1007/b117472

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 2000

  • Hardcover ISBN: 978-0-7923-8669-8Published: 30 September 1999

  • Softcover ISBN: 978-1-4757-8291-2Published: 26 April 2013

  • eBook ISBN: 978-0-306-47544-3Published: 11 April 2006

  • Series ISSN: 0929-1296

  • Edition Number: 1

  • Number of Pages: XVII, 239

  • Topics: Circuits and Systems, Electrical Engineering

Publish with us

Policies and ethics

Back to top

Search

Navigation