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Engineering - Circuits & Systems | Emerging Nanotechnologies - Test, Defect Tolerance, and Reliability

Emerging Nanotechnologies

Test, Defect Tolerance, and Reliability

2008

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  • Discusses test and defect tolerance for crossbar-based nanoscale devices
  • Five chapters focus on test, defect tolerance and reliability for QCA circuits
  • Offers methods for testing and diagnosis of realistic defects in digital microfluidic biochips
  • Includes three chapters on reliability of CMOS scale devices, developing nanoscale processors and future molecular electronics-based circuits

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Content Level » Research

Keywords » CMOS - Nanotechnologie - Nanotube - Technologie - carbon nanotubes - circuit - design - diagnosis - logic - nanotechnology - optimization - planning - reliability - technology - testing

Related subjects » Circuits & Systems - Electronics & Electrical Engineering - Nanotechnology - Production & Process Engineering

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