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This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.
In particular this book includes contributions on three different but complementary axes: core design, computer-aided design tools and test methods.
A collection of chapters deal with the heterogeneity aspect of core designs, showing the diversity of parts that may share the same substrate in a state-of-the-art system on a chip.
The second part of the book discusses CAD in three different levels of design abstraction, from system level to physical design. The third part deals with test methods and the topic is addressed from different viewpoints.
The book further discusses fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs).
Contents Design of Systems on a Chip: Introduction Marcelo Lubaszewski, Ricardo Reis, Jochen A. G. Jess Microsystems Technology and Applications J. Malcolm Wilkinson Core Architectures for Digital Media and the Associated Compilation Techniques Jochen A. G. Jess Past, Present and Future of Microprocessors François Anceau Physical Design Automation Ricardo Reis, Jose Luis Guntzel, Marcelo Johann Behavioral Synthesis: an Overview Reinaldo A. Bergamaschi Hardware/Software co-design A. Jerraya, J. M. Daveau, G. Marchioro, C. Valderrama,M. Romdhani, T. Ben Ismail, N.E. Zergainoh, F. Hessel, P. Coste, Ph. Le Marrec, A. Baghdadi, L. Gauthier Test and Design-for-Test: from Circuits to Integrated Systems Marcelo Lubaszewski Synthesis of FPGAs and Testable ASICs Don W. Bouldin Testable Design and Testing of Microsystems Hans G. Kerkhoff Embedded Core-based System-on-Chip Test Strategies Yervant Zorian