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Inside NAND Flash Memories

  • Book
  • © 2010

Overview

Authors:
  1. Rino Micheloni

    1. Integrated Devices Technology, Agrate Brianza, Italy

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    You can also search for this author in PubMed   Google Scholar

  2. Luca Crippa

    1. Forward Insights, North York, Canada

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    You can also search for this author in PubMed   Google Scholar

  3. Alessia Marelli

    1. Integrated Device Technology, Agrate Brianza, Italy

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    You can also search for this author in PubMed   Google Scholar

  • Flash NAND design
  • NAND – SSD co-development
  • Radiation effects on Flash memories
  • Charge trap technology overview
  • Includes supplementary material: sn.pub/extras

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Table of contents (19 chapters)

  1. Front Matter

    Pages i-x
    Download chapter PDF

  2. Market and applications for NAND Flash memories

    • Gregory Wong
    Pages 1-18

  3. NAND overview: from memory to systems

    • R. Micheloni, A. Marelli, S. Commodaro
    Pages 19-53

  4. Program and erase of NAND memory arrays

    • Christoph Friederich
    Pages 55-88

  5. Reliability issues of NAND Flash memories

    • C. Zambelli, A. Chimenton, P. Olivo
    Pages 89-113

  6. Charge trap NAND technologies

    • Alessandro Grossi
    Pages 115-129

  7. Control logic

    • A. Marelli, R. Micheloni, R. Ravasio
    Pages 131-159

  8. NAND DDR interface

    • Andrea Silvagni
    Pages 161-196

  9. Sensing circuits

    • L. Crippa, R. Micheloni
    Pages 197-233

  10. Parasitic effects and verify circuits

    • L. Crippa, R. Micheloni
    Pages 235-260

  11. MLC storage

    • L. Crippa, R. Micheloni
    Pages 261-298

  12. Charge pumps, voltage regulators and HV switches

    • R. Micheloni, L. Crippa
    Pages 299-327

  13. High voltage overview

    • R. Micheloni, A. Marelli
    Pages 329-351

  14. Redundancy

    • A. Marelli, R. Micheloni
    Pages 353-392

  15. Error correction codes

    • T. Zhang, A. Marelli, R. Micheloni
    Pages 393-422

  16. NAND design for testability and testing

    • Andrea Silvagni
    Pages 423-453

  17. XLC storage

    • R. Micheloni, L. Crippa
    Pages 455-482

  18. Flash cards

    • A. Ghilardelli, S. Corno
    Pages 483-513

  19. Low power 3D-integrated SSD

    • K. Takeuchi
    Pages 515-536

  20. Radiation effects on NAND Flash memories

    • M. Bagatin, G. Cellere, S. Gerardin, A. Paccagnella
    Pages 537-571
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Keywords

About this book

Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just imagine how our recent habits would change if the NAND memories suddenly disappeared. To take a picture it would be necessary to find a film (as well as a traditional camera…), disks or even magnetic tapes would be used to record a video or to listen a song, and a cellular phone would return to be a simple mean of communication rather than a multimedia console. The development of NAND Flash memories will not be set down on the mere evolution of personal entertainment systems since a new killer application can trigger a further success: the replacement of Hard Disk Drives (HDDs) with Solid State Drives (SSDs). SSD is made up by a microcontroller and several NANDs. As NAND is the technology driver for IC circuits, Flash designers and technologists have to deal with a lot of challenges. Therefore, SSD (system) developers must understand Flash technology in order to exploit its benefits and countermeasure its weaknesses. Inside NAND Flash Memories is a comprehensive guide of the NAND world: from circuits design (analog and digital) to Flash reliability (including radiation effects), from testing issues to high-performance (DDR) interface, from error correction codes to NAND applications like Flash cards and SSDs.

Authors and Affiliations

  • Integrated Devices Technology, Agrate Brianza, Italy

    Rino Micheloni

  • Forward Insights, North York, Canada

    Luca Crippa

  • Integrated Device Technology, Agrate Brianza, Italy

    Alessia Marelli

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