Overview
- A comprehensive book on compact models of most commonly used semiconductor devices
- Each chapter is covered by an expert, often responsible for the widely used model with wide industrial applications
- Both traditional and experimental devices are covered
- Critical variability issues are addressed
- Provides detailed coverage of compact model benchmarking which is critical for model development and applications
- Includes supplementary material: sn.pub/extras
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Table of contents (16 chapters)
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Front Matter
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Compact Models of MOS Transistors
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Front Matter
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Compact Models of Bipolar Junction Transistors
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Front Matter
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Compact Models of Passive Devices
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Front Matter
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Modeling of Multiple Gate MOSFETs
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Front Matter
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Statistical Modeling
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Front Matter
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Keywords
About this book
Reviews
From the reviews:
“This excellent reference covers a niche in the recent development of compact modeling for integrated circuit systems. The book can serve as a guide to current research based on the down-scaling of semiconductor devices, particularly for device physicists, electrical engineers and applied mathematicians. The reader will benefit in particular from the coverage of statistical modeling, which treats stochastic system variability and other random effects … . Each chapter is well documented with references, and the underlying theory for each device class is well demonstrated.” (Axel Mainzer Koenig, Optics & Photonics News, May, 2011)Editors and Affiliations
Bibliographic Information
Book Title: Compact Modeling
Book Subtitle: Principles, Techniques and Applications
Editors: Gennady Gildenblat
DOI: https://doi.org/10.1007/978-90-481-8614-3
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2010
Hardcover ISBN: 978-90-481-8613-6Published: 08 September 2010
Softcover ISBN: 978-94-007-9324-8Published: 30 September 2014
eBook ISBN: 978-90-481-8614-3Published: 22 June 2010
Edition Number: 1
Number of Pages: XVII, 527
Topics: Circuits and Systems