Overview
- Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks
- Includes a complete and quantitative vision on the opportunities and limits of technology scaling toward the 10nm regime Addresses the emergent modeling and design needs under ever-increasing variability and reliability concerns
- Covers state-of-the-art compact modeling solutions for CMOS alternatives and post-silicon devices, enabling exploratory design activities beyond traditional CMOS Discusses the seamless integration of the process/materials development and circuit simulation that supports concurrent technology-design research
- Includes supplementary material: sn.pub/extras
Part of the book series: Integrated Circuits and Systems (ICIR)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: Predictive Technology Model for Robust Nanoelectronic Design
Authors: Yu Cao
Series Title: Integrated Circuits and Systems
DOI: https://doi.org/10.1007/978-1-4614-0445-3
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2011
Hardcover ISBN: 978-1-4614-0444-6Published: 12 July 2011
Softcover ISBN: 978-1-4614-3021-6Published: 15 August 2013
eBook ISBN: 978-1-4614-0445-3Published: 12 July 2011
Series ISSN: 1558-9412
Series E-ISSN: 1558-9420
Edition Number: 1
Number of Pages: XV, 173
Topics: Circuits and Systems, Electronics and Microelectronics, Instrumentation, Nanotechnology, Performance and Reliability