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  • Book
  • © 2009

Applied Scanning Probe Methods XI

Scanning Probe Microscopy Techniques

  • First book summarizing the state of the art of this technique
  • Real industrial applications included
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (8 chapters)

  1. Front Matter

    Pages I-LVI
  2. Oscillation Control in Dynamic SPM with Quartz Sensors

    • Johann Jersch, Harald Fuchs
    Pages 1-16
  3. Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation

    • Elmar Bonaccurso, Dmytro S. Golovko, Paolo Bonanno, Roberto Raiteri, Thomas Haschke, Wolfgang Wiechert et al.
    Pages 17-38
  4. Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science

    • Maurice Brogly, Houssein Awada, Olivier Noel
    Pages 73-95
  5. AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip

    • Lorenzo Calabri, Nicola Pugno, Sergio Valeri
    Pages 139-164
  6. Local Mechanical Properties by Atomic Force Microscopy Nanoindentations

    • Davide Tranchida, Stefano Piccarolo
    Pages 165-198
  7. Back Matter

    Pages 231-235

Reviews

From the reviews:

"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Authors and Affiliations

  • Nanoprobe Laboratory for Bio- & Nanotechnology & Biomimetics (NLB2), Ohio State University, Columbus, USA

    Bharat Bhushan

  • Universität Münster FB 16 Physikalisches Institut, Germany

    Harald Fuchs

Bibliographic Information

Buy it now

Buying options

eBook USD 89.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access