Editors:
- First book summarizing the state-of-the-art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (12 chapters)
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Front Matter
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Back Matter
About this book
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
Bharat Bhushan
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Institute of Physics, FB 16, University of Münster, Münster, Germany
Harald Fuchs
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Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan
Masahiko Tomitori
Bibliographic Information
Book Title: Applied Scanning Probe Methods VIII
Book Subtitle: Scanning Probe Microscopy Techniques
Editors: Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/978-3-540-74080-3
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2008
Hardcover ISBN: 978-3-540-74079-7Published: 10 January 2008
Softcover ISBN: 978-3-642-09340-1Published: 16 November 2010
eBook ISBN: 978-3-540-74080-3Published: 20 December 2007
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: LIX, 465
Topics: Nanotechnology and Microengineering, Spectroscopy and Microscopy, Surface and Interface Science, Thin Films, Nanotechnology, Surfaces and Interfaces, Thin Films, Polymer Sciences