Applied Scanning Probe Methods VIII

1. Front Matter

   Pages I-LIX

   PDF

2. Background-Free Apertureless Near-Field Optical Imaging

   • Pietro Giuseppe Gucciardi, Guillaume Bachelier, Stephan J. Stranick, Maria Allegrini

   Pages 1-29

3. Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes

   • Hao-Chih Liu, Gregory A. Dahlen, Jason R. Osborne

   Pages 31-75

4. Near Field Probes: From Optical Fibers to Optical Nanoantennas

   • Eugenio Cefalì, Salvatore Patanè, Salvatore Spadaro, Renato Gardelli, Matteo Albani, Maria Allegrini

   Pages 77-135

5. Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging

   • Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne Marie Bonnot, Jean-Pierre Aimé et al.

   Pages 137-181

6. Scanning Probes for the Life Sciences

   • Andrea M. Ho, Horacio D. Espinosa

   Pages 183-217

7. Self-Sensing Cantilever Sensor for Bioscience

   • Hayato Sone, Sumio Hosaka

   Pages 219-245

8. AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication

   • Vinzenz Friedli, Samuel Hoffmann, Johann Michler, Ivo Utke

   Pages 247-287

9. Cantilever Spring-Constant Calibration in Atomic Force Microscopy

   • Peter J. Cumpson, Charles A. Clifford, Jose F. Portoles, James E. Johnstone, Martin Munz

   Pages 289-314

10. Frequency Modulation Atomic Force Microscopy in Liquids

    • Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma

    Pages 315-350

11. Kelvin Probe Force Microscopy: Recent Advances and Applications

    • Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag

    Pages 351-376

12. Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale

    • Stefan Lanyi

    Pages 377-420

13. Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy

    • Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, G. Gomila

    Pages 421-450

14. Back Matter

    Pages 451-465

    PDF

The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures,technical polymers, and near eld optics.

• AFM
• Nanotube
• PES
• carbon nanotubes
• ceramics
• liquid
• microscopy
• polymer

• Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

  Bharat Bhushan

• Institute of Physics, FB 16, University of Münster, Münster, Germany

  Harald Fuchs

• Advanced Institute of Science & Technology, School of Materials Science, Ishikawa, Japan

  Masahiko Tomitori

Policies and ethics