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Engineering | Applied Scanning Probe Methods VI - Characterization

Applied Scanning Probe Methods VI

Characterization

Bhushan, Bharat, Kawata, Satoshi (Eds.)

2007, XLV, 338 p.

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  • About this book

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications. A partial listing of topics covered includes:

-Scanning Tunneling Microscopy of Physisorbed Monolayers: From Self-Assembly to Molecular Devices

-Tunneling Electron Spectroscopy Towards Chemical Analysis of Single Molecules

-STM Studies on Molecular Assembly at Solid/Liquid Interfaces

-Single-Molecule Studies on Cells and Membranes Using the Atomic Force Microscope

-Atomic Force Microscopy of DNA Structure and Interactions

This series of books constitutes a timely and comprehensive overview of SPM applications. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials.

Content Level » Professional/practitioner

Keywords » AFM - Material Science - Microscopy - Nanoscience - Nanotube - Physical Chemistry - Polymer - STM - Surface Science - ceramics - liquid - spectroscopy

Related subjects » Engineering - Materials - Nanotechnology - Physical Chemistry - Polymer Science - Surfaces, Interfaces, Thin Films, Corrosion, Coatings

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