Editors:
- First book summarizing the state of the art of this technique
- Real industrial applications included
- Includes supplementary material: sn.pub/extras
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
Reviews
From the reviews:
"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)
Editors and Affiliations
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Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA
Bharat Bhushan
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Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany
Harald Fuchs
Bibliographic Information
Book Title: Applied Scanning Probe Methods IV
Book Subtitle: Industrial Applications
Editors: Bharat Bhushan, Harald Fuchs
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/b138289
Publisher: Springer Berlin, Heidelberg
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2006
Hardcover ISBN: 978-3-540-26912-0Published: 22 February 2006
Softcover ISBN: 978-3-642-06597-2Published: 12 February 2010
eBook ISBN: 978-3-540-26914-4Published: 28 April 2006
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XLIV, 284
Topics: Nanotechnology and Microengineering, Spectroscopy and Microscopy, Surface and Interface Science, Thin Films, Nanotechnology, Surfaces and Interfaces, Thin Films, Polymer Sciences