Applied Scanning Probe Methods II

1. Front Matter

   Pages I-XLIII

   PDF

2. Higher Harmonics in Dynamic Atomic Force Microscopy

   • Robert W. Stark, Martin Stark

   Pages 1-36

3. Atomic Force Acoustic Microscopy

   • Ute Rabe

   Pages 37-90

4. Scanning Ion Conductance Microscopy

   • Tilman E. Schäffer, Boris Anczykowski, Harald Fuchs

   Pages 91-119

5. Spin-Polarized Scanning Tunneling Microscopy

   • Wulf Wulfhekel, Uta Schlickum, Jürgen Kirschner

   Pages 121-141

6. Dynamic Force Microscopy and Spectroscopy

   • Ferry Kienberger, Hermann Gruber, Peter Hinterdorfer

   Pages 143-164

7. Sensor Technology for Scanning Probe Microscopy and New Applications

   • Egbert Oesterschulze, Leon Abelmann, Arnout van den Bos, Rainer Kassing, Nicole Lawrence, Gunther Wittstock et al.

   Pages 165-203

8. Quantitative Nanomechanical Measurements in Biology

   • Małgorzata Lekka, Andrzej J. Kulik

   Pages 205-239

9. Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale

   • Pascal Vairac, Bernard Cretin

   Pages 241-281

10. Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices

    • Paul Girard, Alexander Nikolaevitch Titkov

    Pages 283-320

11. Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures

    • Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, Maria Allegrini

    Pages 321-360

12. Focused Ion Beam as a Scanning Probe: Methods and Applications

    • Vittoria Raffa, Piero Castrataro, Arianna Menciassi, Paolo Dario

    Pages 361-412

13. Back Matter

    Pages 413-420

    PDF

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

• Material Science
• Microscopy
• Nanoscience
• PAS
• Physical Chemistry
• REM
• ceramics
• polymer
• spectroscopy

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007)

• Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

  Bharat Bhushan

• Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany

  Harald Fuchs

Policies and ethics