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  • © 2016

Machine Vision

Automated Visual Inspection: Theory, Practice and Applications

  • The reader is supposed to get a thorough understanding of the interaction of the presented methods

  • All relevant conclusions are provided with at least a sketch of proof

  • The reader will be provided with the “big picture” of the field

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Table of contents (16 chapters)

  1. Front Matter

    Pages I-XX
  2. Introduction

    • Jürgen Beyerer, Fernando Puente León, Christian Frese
    Pages 1-17
  3. Image Acquisition

    1. Front Matter

      Pages 19-19
    2. Light

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 21-96
    3. Optical Imaging

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 97-141
    4. Radiometry

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 143-161
    5. Color

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 163-202
    6. Sensors for Image Acquisition

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 203-221
    7. Methods of Image Acquisition

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 223-365
  4. Image Processing

    1. Front Matter

      Pages 367-367
    2. Image Signals

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 369-464
    3. Preprocessing and Image Enhancement

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 465-519
    4. Image Restoration

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 521-551
    5. Segmentation

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 553-605
    6. Morphological Image Processing

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 607-647
    7. Texture Analysis

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 649-683
    8. Detection

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 685-720
    9. Image Pyramids, the Wavelet Transfm and Multiresolution Analysis

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 721-750
  5. Appendix

    1. Front Matter

      Pages 751-751
    2. A Mathematical Foundations

      • Jürgen Beyerer, Fernando Puente León, Christian Frese
      Pages 753-767

About this book

The book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure.
The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection.

Authors and Affiliations

  • Fraunhofer-Institut für Optronik Systemtechnik und Bildauswertung, Karlsruhe, Germany

    Jürgen Beyerer

  • The Karlsruhe Institute of Technology, Karlsruhe, Germany

    Fernando Puente León, Christian Frese

About the authors

Prof. Dr.-Ing. habil. Jürgen Beyerer received his doctoral degree in 1994 by working in the field of image processing and especially in the subject of texture analysis. He habilitated in 1994 in the field of measurement technology and ran a small business for five years, which developed innovative automated visual inspection systems for industrial applications. Since 2004, Prof. Beyerer is the director of the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation in Karlsruhe, which is mainly focused on the field of image processing. Simultaneously, he is holding the chair `Vision and Fusion Laboratory’ at the Karlsruhe Institute of Technology (KIT) which performs research in the fields of image acquisition and image processing.

Prof. Dr.-Ing. Fernando Puente León: received the Dipl.-Ing. degree in electrical engineering and the Ph.D. degree with a thesis on machine vision from the University of Karlsruhe, Germany, in 1994 and 1999, respectively. From 2001 to 2002, he was with the
company DS2, Spain. In 2003, he became a full professor at the Department of Electrical Engineering and Information Technology of the Technical University of Munich, Germany. Since 2008, he is a professor with the Department of Electrical Engineering and Information Technology of Karlsruhe Institute of Technology, where he also heads the Institute of Industrial Information Technology. His research interests include image processing, machine vision, information fusion, measurement technology, and pattern
recognition.

Dr.-Ing. Christian Frese has been engaged in the field of computer vision and image processing since 2005. He has been actively participating in several research projects concerned with multi-view stereo reconstruction, range image processing, image fusion,
feature extraction and image-based classification. He co-authored more than 25 scientific publications related to cognitive automobiles, robotics, and image

processing. 

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 249.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access