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Computer Science - Image Processing | Precision Landmark Location for Machine Vision and Photogrammetry - Finding and Achieving the (Authors and Editors)

Precision Landmark Location for Machine Vision and Photogrammetry

Finding and Achieving the Maximum Possible Accuracy

Gutierrez, José A., Armstrong, Brian S.R.

2008, XI, 162 p. With online files/update.

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José A. Gutiérrez is Principal Engineer at the Innovation Center of Eaton Corporation, leading the technical activities in Wireless Sensor Networks. He received the B.S. degree in electronic engineering from Universidad Simon Bolivar in Caracas, Venezuela, in 1991, and the M.S. in electrical engineering from the University of Wisconsin - Milwaukee in 2001. Currently he is a Ph.D. candidate at the same institution. Mr. Gutiérrez is an active member of the IEEE LAN/MAN Standards Committee and Editor in-Chief of the IEEE 802.15 Working Group, Task Group 4, focused in the development of Low-Rate Wireless Personal Area Networks. His areas of expertise include control systems, wireless communication, networking, information theory, bioelectronics, and standards development. He has two patents filed and is author of several papers in the areas of automatic control, artificial intelligence, and wireless communications.

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    Precision Landmark Location for Machine Vision and Photogrammetry

    Finding and Achieving the Maximum Possible Accuracy

    Gutierrez, José A., Armstrong, Brian S.R. 2008

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    $119.00 (net)
    ISBN 978-1-84628-913-2
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