Editors:
Part of the book series: Lecture Notes in Computer Science (LNCS, volume 8481)
Part of the book sub series: Lecture Notes in Artificial Intelligence (LNAI)
Conference series link(s): IEA/AIE: International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems
Conference proceedings info: IEA/AIE 2014.
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Table of contents (53 papers)
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Front Matter
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Agent Technology
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Computational Intelligence and Applications
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Data Mining and QA Technology
Other Volumes
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Modern Advances in Applied Intelligence
About this book
Editors and Affiliations
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Department of Computer Science, Texas State University, San Marcos, USA
Moonis Ali
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Department of Electronic Engineering, National Kaohsiung University of Applied Sciences, Kaohsiung, Taiwan
Jeng-Shyang Pan
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Department of Computer Science and Information Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan
Shyi-Ming Chen
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Department of Electronics Engineering, National Kaohsiung University of Applied Sciences, Kaohsiung, Taiwan (ROC)
Mong-Fong Horng
Bibliographic Information
Book Title: Modern Advances in Applied Intelligence
Book Subtitle: 27th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2014, Kaohsiung, Taiwan, June 3-6, 2014, Proceedings, Part I
Editors: Moonis Ali, Jeng-Shyang Pan, Shyi-Ming Chen, Mong-Fong Horng
Series Title: Lecture Notes in Computer Science
DOI: https://doi.org/10.1007/978-3-319-07455-9
Publisher: Springer Cham
eBook Packages: Computer Science, Computer Science (R0)
Copyright Information: Springer International Publishing Switzerland 2014
Softcover ISBN: 978-3-319-07454-2Published: 21 May 2014
eBook ISBN: 978-3-319-07455-9Published: 20 May 2014
Series ISSN: 0302-9743
Series E-ISSN: 1611-3349
Edition Number: 1
Number of Pages: XXVI, 524
Number of Illustrations: 188 b/w illustrations
Topics: Artificial Intelligence, Information Systems Applications (incl. Internet), Algorithm Analysis and Problem Complexity, Data Mining and Knowledge Discovery, Computer Imaging, Vision, Pattern Recognition and Graphics