Electron Nano-Imaging

1. Front Matter

   Pages i-xxviii

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2. Nano-imaging by Transmission Electron Microscopy

   1. Front Matter

      Pages 1-1

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   2. Seeing Nanometer-Sized World

      • Nobuo Tanaka

      Pages 3-15

   3. Structure and Imaging of a Transmission Electron Microscope (TEM)

      • Nobuo Tanaka

      Pages 17-28

   4. Basic Theories of TEM Imaging

      • Nobuo Tanaka

      Pages 29-42

   5. Resolution and Image Contrast of a Transmission Electron Microscope (TEM)

      • Nobuo Tanaka

      Pages 43-57

   6. What is High-Resolution Transmission Electron Microscopy?

      • Nobuo Tanaka

      Pages 59-72

   7. Lattice Images and Structure Images

      • Nobuo Tanaka

      Pages 73-86

   8. Imaging Theory of High-Resolution TEM and Image Simulation

      • Nobuo Tanaka

      Pages 87-110

   9. Advanced Transmission Electron Microscopy

      • Nobuo Tanaka

      Pages 111-145

3. Nano-imaging by Scanning Transmission Electron Microscopy

   1. Front Matter

      Pages 147-147

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   2. What is Scanning Transmission Electron Microscopy (STEM)?

      • Nobuo Tanaka

      Pages 149-159

   3. Imaging of Scanning Transmission Electron Microscopy (STEM)

      • Nobuo Tanaka

      Pages 161-166

   4. Image Contrast and Its Formation Mechanism in STEM

      • Nobuo Tanaka

      Pages 167-190

   5. Imaging Theory for STEM

      • Nobuo Tanaka

      Pages 191-202

   6. Future Prospects and Possibility of TEM and STEM

      • Nobuo Tanaka

      Pages 203-212

   7. Concluding Remarks

      • Nobuo Tanaka

      Pages 213-215

4. Appendix: Basics for Understanding TEM and STEM Imaging

   1. Front Matter

      Pages 217-217

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   2. Introduction to Fourier Transforms for TEM and STEM

      • Nobuo Tanaka

      Pages 219-226

   3. Imaging by Using a Convex Lens as a Phase Shifter

      • Nobuo Tanaka

      Pages 227-233

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide fortoday’s graduate students and professionals just starting their careers.

• Bethe Method
• Cowley's Theory
• Electron Wave Optics
• Energy-filtered Transmission Electron Microscopy
• High-resolution Electron Microscopy
• Howies–Whelan Method
• Lattice Fringe Images
• Magnetic Lenses
• Van Dyck Method

“I enjoyed reading this book. It covers a wide range of applications, from basics on electron microscopy and diffraction, to more advanced, newly developed techniques for imaging and diffraction. … I strongly recommend this book as a resource for electron microscopists with a basic knowledge of TEM and STEM who are interested in advanced imaging and diffraction techniques.” (Lourdes Salamanca-Riba, MRS Bulletin, Vol. 43, May, 2018)

• Nagoya University, Nagoya, Japan

  Nobuo Tanaka

Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC). He received a ph.D degree from Applied Physics Department of Nagoya University in 1978, and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004. He was the director of the institute from 2012 to 2015. He is also the president of Japanese Microscopy Society (JSM) from 2015 to 2017. His professionals are high-resolution electron microscopy and nano-diffraction, and physics of atomic clusters and thin filmsas well as surfaces and interfaces of semiconductors. He is also the editor/author of a textbook as Scanning Transmission Electron Microscopy of Nanomaterials.

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