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Chemistry - Polymer Science | Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy

Synthetic Polymeric Membranes

Characterization by Atomic Force Microscopy

Khulbe, K. C., Feng, C. Y., Matsuura, Takeshi

2008, XVIII, 190 p., 216 illus.

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  • First book which combines both fields AFM and Synthetic Membranes
  • Comprehensive treatment of the subject makes this an ideal overall guide to the subject area.
  • Highly practical work with details of AFM experimental methods and interpretation of experimental data

This is a much-needed text that focuses on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM).

AFM is becoming a very important tool for the characterization of synthetic polymeric membranes, as The development of membranes for improved performance depends on the exact knowledge of the morphology of a thin selective layer that exists at the surface of the membrane.

The control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of twenty-five years, AFM has firmly established its position as a means of characterizing the membrane surface.

Here, each chapter includes information on the basic principles, commercial applications, an overview of current research and guidelines for future research. Each also includes a summary and comprehensive list of references.

The book covers all aspects of AFM studies on the characterization of synthetic polymeric membranes.

This work will be of wide interest, as synthetic membranes are now considered to be one of the most important tools in areas as cru

Content Level » Research

Keywords » AFM - Atomic Force Microscopy - Helium-Atom-Streuung - Membranes - PED - Polymer - Polymers - Surfaces - morphology

Related subjects » Analytical Chemistry - Biomedical Sciences - Food Science & Nutrition - Industrial Chemistry and Chemical Engineering - Polymer Science

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