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Particle Characterization: Light Scattering Methods

  • Book
  • © 2002

Overview

Authors:
  1. Renliang Xu

    1. Beckman Coulter, Miami, USA

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    You can also search for this author in PubMed   Google Scholar

Editors:
  1. Brian Scarlett

    1. Technical University of Delft, Delft, The Netherlands

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Particle Technology Series (POTS, volume 13)

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Table of contents (6 chapters)

  1. Front Matter

    Pages I-XVI
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  2. Particle Characterization

    Pages 1-55

  3. Light Scattering

    Pages 56-110

  4. Laser Diffraction

    Pages 111-181

  5. Optical Particle Counting

    Pages 182-222

  6. Photon Correlation Spectroscopy

    Pages 223-288

  7. Electrophoretic Light Scattering

    Pages 289-343

  8. Back Matter

    Pages 344-398
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Keywords

About this book

Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering.
In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided.
The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

Authors, Editors and Affiliations

  • Technical University of Delft, Delft, The Netherlands

    Brian Scarlett

  • Beckman Coulter, Miami, USA

    Renliang Xu

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