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Chemistry - Physical Chemistry | Particle Characterization: Light Scattering Methods

Particle Characterization: Light Scattering Methods

Series: Particle Technology Series, Vol. 13

Xu, Renliang

2000, XVII, 399 p.

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Particle characterization is an important component in product research and development, manufacture, and quality control of particulate materials and an important tool in the frontier of sciences, such as in biotechnology and nanotechnology. This book systematically describes one major branch of modern particle characterization technology - the light scattering methods. This is the first monograph in particle science and technology covering the principles, instrumentation, data interpretation, applications, and latest experimental development in laser diffraction, optical particle counting, photon correlation spectroscopy, and electrophoretic light scattering.
In addition, a summary of all major particle sizing and other characterization methods, basic statistics and sample preparation techniques used in particle characterization, as well as almost 500 latest references are provided.
The book is a must for industrial users of light scattering techniques characterizing a variety of particulate systems and for undergraduate or graduate students who want to learn how to use light scattering to study particular materials, in chemical engineering, material sciences, physical chemistry and other related fields.

Content Level » Research

Keywords » control - diffraction - experiment - laser - light scattering - material sciences - measurement - nanotechnology - physical chemistry - spectroscopy

Related subjects » Analytical Chemistry - Applied & Technical Physics - Characterization & Evaluation of Materials - Physical Chemistry

Table of contents 

Preface. Acknowledgements. 1. Particle Characterization - An Overview. 2. Light Scattering - The Background Information. 3. Laser Diffraction - Sizing from Nanometers to Millimeters. 4. Optical Particle Counting - Counting and Sizing. 5. Photon Correlation Spectroscopy - Submicron Particle Characterization. 6. Electrophoretic Light Scattering - Zeta Potential Measurement. Appendices. Author Index. Subject Index.

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