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Secondary Ion Mass Spectrometry SIMS V

Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

  • Conference proceedings
  • © 1986

Overview

Editors:
  1. Alfred Benninghoven

    1. Physikalisches Institut, Universität Münster, Münster, Fed. Rep. of Germany

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  2. Richard J. Colton

    1. Chemistry Division, Naval Research Laboratory, USA

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  3. David S. Simons

    1. Center for Analytical Chemistry, National Bureau of Standards, Gaithersburg, USA

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  4. Helmut W. Werner

    1. Philips Research Laboratories, NL-Eindhoven, The Netherlands

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Part of the book series: Springer Series in Chemical Physics (CHEMICAL, volume 44)

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Table of contents (149 papers)

  1. Front Matter

    Pages I-XXI
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  3. Fundamentals

    1. Front Matter

      Pages 17-17
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    2. Density-Functional Studies of the Atom-Surface Interaction and the Ionization Probability of Sputtered Atoms

      • N. D. Lang
      Pages 18-25

    3. Origin of the Chemical Enhancement of Positive Secondary Ion Yield in SIMS

      • K. Mann, M. L. Yu
      Pages 26-28

    4. Ion Pair Production as Main Process of SIMS for Inorganic Solids

      • C. Plog, G. Roth, W. Gerhard, W. Kerfin
      Pages 29-31

    5. Sputtering and Secondary Ion Emission From Metals and Alloys Subjected to Oxygen Ion Bombardment

      • Y. Taga
      Pages 32-37

    6. Measurements of the SIMS Isotope Effect

      • S. A. Schwarz
      Pages 38-40

    7. SIMS Study of Self-Diffusion in Liquid Tin and of Associated Isotope Effects

      • U. Södervall, H. Odelius, A. Lodding, G. Frohberg, K. H. Kraatz, H. Wever
      Pages 41-44

    8. Silicon-Induced Enhancement of Secondary Ion Emission in Silicates: A Study of the Matrix Effects

      • N. Shimizu
      Pages 45-47

    9. Ionization Probabilities of Polycrystalline Metal Surfaces

      • M. M. Brudny, K. D. Klöppel
      Pages 48-50

    10. Reactivity and Structure of Sputtered Species

      • R. B. Freas, J. E. Campana
      Pages 51-53

    11. Local Thermal Equilibrium Model of Molecular Secondary Ion Emission

      • P. J. Todd
      Pages 54-56

    12. Time-of-Flight Investigations of Secondary Ion Emission from Metal Halides

      • B. Schueler, R. Beavis, G. Bolbach, W. Ens, D. E. Main, K. G. Standing
      Pages 57-59

    13. Multicharged Secondary Ions from Light Metals (Mg, Al, Si)

      • J.-F. Hennequin, R.-L. Inglebert, P. Viaris de Lesegno
      Pages 60-62

    14. Population of Ion Clusters Sputtered from Metallic Elements with 10 keV Ar+

      • F. G. Satkiewicz
      Pages 63-65

    15. Ejection and Ionization Efficiencies in Electron and Ion-Stimulated Desorption from Covalently Bound Surface Structures

      • T. R. Hayes, J. F. Evans
      Pages 66-68

  4. Symposium: Detection of Sputtered Neutrals

    1. Front Matter

      Pages 69-69
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    2. Electron Gas SNMS

      • H. Oechsner
      Pages 70-74
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Keywords

Editors and Affiliations

  • Physikalisches Institut, Universität Münster, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

  • Chemistry Division, Naval Research Laboratory, USA

    Richard J. Colton

  • Center for Analytical Chemistry, National Bureau of Standards, Gaithersburg, USA

    David S. Simons

  • Philips Research Laboratories, NL-Eindhoven, The Netherlands

    Helmut W. Werner

Bibliographic Information

  • Book Title: Secondary Ion Mass Spectrometry SIMS V

  • Book Subtitle: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985

  • Editors: Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner

  • Series Title: Springer Series in Chemical Physics

  • DOI: https://doi.org/10.1007/978-3-642-82724-2

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1986

  • Softcover ISBN: 978-3-642-82726-6Published: 11 January 2012

  • eBook ISBN: 978-3-642-82724-2Published: 06 December 2012

  • Series ISSN: 0172-6218

  • Series E-ISSN: 2364-9003

  • Edition Number: 1

  • Number of Pages: XXII, 564

  • Topics: Mass Spectrometry, Solid State Physics, Spectroscopy and Microscopy, Physical Chemistry

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