Editors:
- Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed
- Many current results and new directions for future research are featured
- Contains extensive references to research articles, books, and relevant computer software
- May be used as a textbook for a graduate-level seminar on scan statistics
Part of the book series: Statistics for Industry and Technology (SIT)
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Table of contents (17 chapters)
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Front Matter
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Back Matter
About this book
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. The chapters are written by leading experts in the field of scan statistics. Key features include many current results and new directions for future research; challenging theoretical methodological research problems; presentation accessible to both statisticians and scientists from other disciplines where scan statistics are employed; emphasis on real-world applications to areas such as bioinformatics and biosurveillance; and extensive references to research articles, books, and relevant computer software.
Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.
Reviews
From the reviews:
“The area of scan statistics has developed rapidly in recent years. … provided excellent overviews of the area. … There are many papers of interest here for the readers of Technometrics. … This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified.” (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)Editors and Affiliations
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Dept. Statistics, University of Connecticut, Storrs, U.S.A.
Joseph Glaz, Vladimir Pozdnyakov
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Center for Biomathematical Sciences, Mount Sinai School of Medicine, New York, U.S.A.
Sylvan Wallenstein
Bibliographic Information
Book Title: Scan Statistics
Book Subtitle: Methods and Applications
Editors: Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein
Series Title: Statistics for Industry and Technology
DOI: https://doi.org/10.1007/978-0-8176-4749-0
Publisher: Birkhäuser Boston, MA
eBook Packages: Mathematics and Statistics, Mathematics and Statistics (R0)
Copyright Information: Birkhäuser Boston 2009
Hardcover ISBN: 978-0-8176-4748-3Published: 28 May 2009
eBook ISBN: 978-0-8176-4749-0Published: 24 December 2009
Series ISSN: 2364-6241
Series E-ISSN: 2364-625X
Edition Number: 1
Number of Pages: XXVIII, 394
Number of Illustrations: 40 b/w illustrations
Topics: Statistical Theory and Methods, Statistics for Life Sciences, Medicine, Health Sciences, Probability Theory and Stochastic Processes, Physiological, Cellular and Medical Topics, Probability and Statistics in Computer Science, Applications of Mathematics