Overview
- A practically oriented textbook representing a clear and comprehensible introduction
- Based on the authors’ experiences acquired from frequently asked questions by students
- Provides practical information in the application of techniques and easy explanations of the underlying theory
- Includes supplementary material: sn.pub/extras
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Table of contents (10 chapters)
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Front Matter
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Back Matter
About this book
This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points.
This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.
Authors and Affiliations
About the authors
Jürgen Thomas (born in 1948) studied physics at the TU Dresden from 1966 to 1971. In 1970 he had the first contact with electron microscopy and received finally his diploma and doctoral degree on topics of electron microscopy and electron-solid-interactions under supervision of Prof. Alfred Recknagel in Dresden. Between 1978 and 1989 he was responsible for the development of technologies for electron-beam welding and vacuum drying in the industrial research. In 1990 he went back to the electron microscopy and joined the Leibniz Institute for Solid State and Materials Research (IFW) Dresden where he has been working in the laboratory for analytical transmission electron microscopy until today.
Thomas Gemming (born in 1969) studied physics at the University Karlsruhe from 1988 to 1994. He received his doctoral degree on high-resolution transmission electron microscopy in the group of Prof. Manfred Rühle at the Max-Planck-Institut für Metallforschung in Stuttgart in 1998. Afterwards he expanded his field of work to analytical transmission electron microscopy. In 2000 he moved to the Leibniz Institute for Solid State and Materials Research (IFW Dresden) where he is currently working as a department head for Micro- and Nanostructures. Additionally he is currently the executive secretary of the German Society for Electron Microscopy (DGE).
Bibliographic Information
Book Title: Analytical Transmission Electron Microscopy
Book Subtitle: An Introduction for Operators
Authors: Jürgen Thomas, Thomas Gemming
DOI: https://doi.org/10.1007/978-94-017-8601-0
Publisher: Springer Dordrecht
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media Dordrecht 2014
Hardcover ISBN: 978-94-017-8600-3Published: 06 May 2014
Softcover ISBN: 978-94-017-7988-3Published: 23 August 2016
eBook ISBN: 978-94-017-8601-0Published: 17 April 2014
Edition Number: 1
Number of Pages: XVII, 348
Number of Illustrations: 205 b/w illustrations, 33 illustrations in colour
Topics: Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Spectroscopy/Spectrometry, Nanotechnology and Microengineering