Authors:
- Presents a comprehensive overview of Logic Circuits
- Combines theory with practical examples
- Multi-discipline approach to the "hot" topic of uncertainty
- Includes supplementary material: sn.pub/extras
Part of the book series: Lecture Notes in Electrical Engineering (LNEE, volume 115)
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Table of contents (7 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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, Dept. of Biological Sciences, Columbia University, New York, USA
Smita Krishnaswamy
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, Dept. of EECS, University of Michigan, Ann Arbor, USA
Igor L. Markov, John P. Hayes
Bibliographic Information
Book Title: Design, Analysis and Test of Logic Circuits Under Uncertainty
Authors: Smita Krishnaswamy, Igor L. Markov, John P. Hayes
Series Title: Lecture Notes in Electrical Engineering
DOI: https://doi.org/10.1007/978-90-481-9644-9
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media Dordrecht 2013
Hardcover ISBN: 978-90-481-9643-2Published: 21 September 2012
Softcover ISBN: 978-94-007-9798-7Published: 15 October 2014
eBook ISBN: 978-90-481-9644-9Published: 21 September 2012
Series ISSN: 1876-1100
Series E-ISSN: 1876-1119
Edition Number: 1
Number of Pages: XII, 124
Topics: Circuits and Systems, Arithmetic and Logic Structures, Computer Hardware, Performance and Reliability, Logic Design, Symbolic and Algebraic Manipulation