Overview
- Scientific status report on analytical techniques in nano-and surface sciences
- Presentation of the basics and applications of various surface and thin film analytical -techniques: Scanning Probe Microscopy, X-ray diffraction at synchrotron, Free-Electron-Laser sources, Ultra-fast TEM and Electron Diffraction, FIB/SEM, X-ray photoelectron spectroscopy
- Presentation of advanced techniques for bulk analysis: X-ray absorption spectroscopy, Time-Resolved Neutron Scattering
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Materials Science (SSMATERIALS, volume 193)
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Table of contents (7 chapters)
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: In-situ Materials Characterization
Book Subtitle: Across Spatial and Temporal Scales
Editors: Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
Series Title: Springer Series in Materials Science
DOI: https://doi.org/10.1007/978-3-642-45152-2
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2014
Hardcover ISBN: 978-3-642-45151-5Published: 10 April 2014
Softcover ISBN: 978-3-662-51976-9Published: 23 August 2016
eBook ISBN: 978-3-642-45152-2Published: 01 April 2014
Series ISSN: 0933-033X
Series E-ISSN: 2196-2812
Edition Number: 1
Number of Pages: XI, 256
Number of Illustrations: 46 b/w illustrations, 78 illustrations in colour
Topics: Nanoscale Science and Technology, Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Surfaces and Interfaces, Thin Films, Nanotechnology, Structural Materials