Editors:
- Gives a survey of advanced methods in current optical measurements
- Reviews the most up-to-date topics in an introductory way
- Numerous references to the original works help students and newcomers to enter the field
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 180)
Buy it now
Buying options
Tax calculation will be finalised at checkout
Other ways to access
This is a preview of subscription content, log in via an institution to check for access.
Table of contents (12 chapters)
-
Front Matter
-
Reflectance Spectroscopy
-
Front Matter
-
-
Ultrafast and Coherent Measurement
-
Front Matter
-
-
Back Matter
About this book
Editors and Affiliations
-
Yokohama National University, Yokohama National University, Yokohama, Japan
Ken-ichi Shudo
-
Faculty of Engeneering, Yokohama National University, Yokohama, Japan
Ikufumui Katayama, Shin-Ya Ohno
Bibliographic Information
Book Title: Frontiers in Optical Methods
Book Subtitle: Nano-Characterization and Coherent Control
Editors: Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-3-642-40594-5
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2014
Hardcover ISBN: 978-3-642-40593-8Published: 17 December 2013
Softcover ISBN: 978-3-662-50731-5Published: 23 August 2016
eBook ISBN: 978-3-642-40594-5Published: 04 December 2013
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XII, 228
Number of Illustrations: 69 b/w illustrations, 70 illustrations in colour
Topics: Optics, Lasers, Photonics, Optical Devices, Atomic, Molecular, Optical and Plasma Physics, Spectroscopy and Microscopy, Microwaves, RF and Optical Engineering, Nanotechnology