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Hardware and Software: Verification and Testing

4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008, Revised Selected Papers

  • Conference proceedings
  • © 2009

Overview

Editors:
  1. Hana Chockler

    1. IBM Haifa Labs, Haifa University Campus, Mount Carmel, Haifa, Israel

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    You can also search for this editor in PubMed   Google Scholar

  2. Alan J. Hu

    1. Department of Computer Science, University of British Columbia, Vancouver, Canada

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    You can also search for this editor in PubMed   Google Scholar

Part of the book series: Lecture Notes in Computer Science (LNCS, volume 5394)

Part of the book sub series: Programming and Software Engineering (LNPSE)

Included in the following conference series:

Conference proceedings info: HVC 2008.

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Table of contents (22 papers)

  1. Front Matter

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  3. Section 2: Regular Papers

    1. A Framework for Inherent Vacuity

      • Dana Fisman, Orna Kupferman, Sarai Sheinvald-Faragy, Moshe Y. Vardi
      Pages 7-22

    2. A Meta Heuristic for Effectively Detecting Concurrency Errors

      • Neha Rungta, Eric G. Mercer
      Pages 23-37

    3. A Uniform Approach to Three-Valued Semantics for μ-Calculus on Abstractions of Hybrid Automata

      • Kerstin Bauer, Raffaella Gentilini, Klaus Schneider
      Pages 38-52

    4. Automatic Boosting of Cross-Product Coverage Using Bayesian Networks

      • Dorit Baras, Laurent Fournier, Avi Ziv
      Pages 53-67

    5. Efficient Decision Procedure for Bounded Integer Non-linear Operations Using SMT(\(\mathcal{LIA}\))

      • Malay K. Ganai
      Pages 68-83

    6. Evaluating Workloads Using Comparative Functional Coverage

      • Yoram Adler, Dale Blue, Thomas Conti, Richard Prewitt, Shmuel Ur
      Pages 84-98

    7. Iterative Delta Debugging

      • Cyrille Artho
      Pages 99-113

    8. Linear-Time Reductions of Resolution Proofs

      • Omer Bar-Ilan, Oded Fuhrmann, Shlomo Hoory, Ohad Shacham, Ofer Strichman
      Pages 114-128

    9. Significant Diagnostic Counterexamples in Probabilistic Model Checking

      • Miguel E. Andrés, Pedro D’Argenio, Peter van Rossum
      Pages 129-148

    10. Statistical Model Checking of Mixed-Analog Circuits with an Application to a Third Order Δ − Σ Modulator

      • Edmund Clarke, Alexandre Donzé, Axel Legay
      Pages 149-163

    11. Structural Contradictions

      • Cindy Eisner, Dana Fisman
      Pages 164-178

    12. Synthesizing Test Models from Test Cases

      • Antti Jääskeläinen, Antti Kervinen, Mika Katara, Antti Valmari, Heikki Virtanen
      Pages 179-193

  4. Section 3: Tool Papers

    1. d-TSR: Parallelizing SMT-Based BMC Using Tunnels over a Distributed Framework

      • Malay K. Ganai, Weihong Li
      Pages 194-199
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About this book

These are the conference proceedings of the 4th Haifa Veri?cation Conference, held October 27–30, 2008 in Haifa, Israel. This international conference is a unique venue that brings together leading researchers and practitioners of both formal and dynamic veri?cation, for both hardware and software systems. This year’s conference extended the successes of the previous years, with a largejumpinthenumberofsubmitted papers. Wereceived49totalsubmissions, with many more high-quality papers than we had room to accept. Submissions came from 19 di?erent countries, re?ecting the growing international visibility of the conference. Of the 49 submissions, 43 were regular papers, 2 of which were later withdrawn, and 6 were tool papers. After a rigorous review process, in which each paper received at least four independent reviews from the dist- guished Program Committee, we accepted 12 regular papers and 4 tools papers for presentation at the conference and inclusion in this volume. These numbers give acceptance rates of 29% for regular papers and 67% for tool papers (34% combined) — comparable to the elite, much older, conferences in the ?eld. A Best Paper Award, selected on the basis of the reviews and scores from the Program Committee, was presented to Edmund Clarke, Alexandre Donz´ e, and AxelLegayfortheirpaperentitled“StatisticalModelCheckingofMixed-Analog Circuits with an Application to a Third-Order Delta-Sigma Modulator. ” The refereed program was complemented by an outstanding program of - vited talks, panels, and special sessions from prominent leaders in the ?eld.

Editors and Affiliations

  • IBM Haifa Labs, Haifa University Campus, Mount Carmel, Haifa, Israel

    Hana Chockler

  • Department of Computer Science, University of British Columbia, Vancouver, Canada

    Alan J. Hu

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