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Table of contents (417 papers)
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Front Matter
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Instrumentation and Methods
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TEM and STEM instrumentation and Electron Optics
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Aberration Correctors
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About this book
Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.
Editors and Affiliations
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Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, Jülich, Germany
Martina Luysberg, Karsten Tillmann
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Central Facility for Electron Microscopy, RWTH Aachen, Aachen, Germany
Thomas Weirich
Bibliographic Information
Book Title: EMC 2008
Book Subtitle: Vol 1: Instrumentation and Methods
Editors: Martina Luysberg, Karsten Tillmann, Thomas Weirich
DOI: https://doi.org/10.1007/978-3-540-85156-1
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2008
Hardcover ISBN: 978-3-540-85154-7Published: 26 August 2008
Softcover ISBN: 978-3-662-50225-9Published: 23 August 2016
eBook ISBN: 978-3-540-85156-1Published: 29 August 2008
Edition Number: 1
Number of Pages: XXXVIII, 862
Topics: Physics, general