Authors:
- Comprehensive overview
Part of the book series: Springer Tracts in Modern Physics (STMP, volume 223)
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Table of contents (8 chapters)
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Front Matter
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Back Matter
About this book
The aim of the book is to give an actual survey on the resistivity of thin metal and semiconductor films interacting with gases. We discuss the influence of the substrate material and the annealing treatment of the films, presenting our experimental data as well as theoretical models to calculate the scattering cross section of the conduction electrons in the frame-work of the scattering hypothesis. Main emphasis is laid on the comparison of gold and silver films which exhibit nearly the same lattice structure but differ in their chemical activity. In conclusion, the most important quantity for the interpretation is the surface charging z while the correlation with the optical data or the frustrated IR vibrations seems the show a more material-specific character. Z can be calculated on the basis of the density functional formalism or the self-consistent field approximation using Mulliken’s population analysis.
Authors and Affiliations
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Institut für Physikalische und Theoretische Chemie, Universität Erlangen-Nürnberg, Erlangen, Germany
Peter Wißmann
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Hochschule Niederrhein, FB Chemie, Krefeld, Germany
Hans-Ulrich Finzel
Bibliographic Information
Book Title: Electrical Resistivity of Thin Metal Films
Authors: Peter Wißmann, Hans-Ulrich Finzel
Series Title: Springer Tracts in Modern Physics
DOI: https://doi.org/10.1007/3-540-48490-6
Publisher: Springer Berlin, Heidelberg
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag Berlin Heidelberg 2007
Hardcover ISBN: 978-3-540-48488-2Published: 13 December 2006
Softcover ISBN: 978-3-642-08013-5Published: 22 November 2010
eBook ISBN: 978-3-540-48490-5Published: 19 April 2007
Series ISSN: 0081-3869
Series E-ISSN: 1615-0430
Edition Number: 1
Number of Pages: VII, 128
Number of Illustrations: 123 b/w illustrations
Topics: Condensed Matter Physics