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Applied Scanning Probe Methods III

Characterization

  • Book
  • © 2006

Overview

Editors:
  1. Bharat Bhushan

    1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

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    You can also search for this editor in PubMed   Google Scholar

  2. Harald Fuchs

    1. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  • First book summarizing the state of the art of this technique
  • Real industrial applications included
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (11 chapters)

  1. Front Matter

    Pages I-XLIII
    Download chapter PDF

  2. Atomic Force Microscopy in Nanomedicine

    • Dessy Nikova, Tobias Lange, Hans Oberleithner, Hermann Schillers, Andreas Ebner, Peter Hinterdorfer
    Pages 1-26

  3. Scanning Probe Microscopy: From Living Cells to the Subatomic Range

    • Ille C. Gebeshuber, Manfred Drack, Friedrich Aumayr, Hannspeter Winter, Friedrich Franek
    Pages 27-53

  4. Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces

    • Zachary Burton, Bharat Bhushan
    Pages 55-81

  5. Probing Macromolecular Dynamics and the Influence of Finite Size Effects

    • Scott Sills, René M. Overney
    Pages 83-130

  6. Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum

    • Laurent Nony, Enrico Gnecco, Ernst Meyer
    Pages 131-182

  7. One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures

    • Luca Gavioli, Massimo Sancrotti
    Pages 183-215

  8. Scanning Probe Microscopy Applied to Ferroelectric Materials

    • Oleg Tikhomirov, Massimiliano Labardi, Maria Allegrini
    Pages 217-259

  9. Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy

    • Renato Buzio, Ugo Valbusa
    Pages 261-298

  10. AFM Applications for Contact and Wear Simulation

    • Nikolai K. Myshkin, Mark I. Petrokovets, Alexander V. Kovalev
    Pages 299-326

  11. AFM Applications for Analysis of Fullerene-Like Nanoparticles

    • Lev Rapoport, Armen Verdyan
    Pages 327-342

  12. Scanning Probe Methods in the Magnetic Tape Industry

    • James K. Knudsen
    Pages 343-369

  13. Back Matter

    Pages 371-378
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Keywords

About this book

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Reviews

From the reviews:

"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007

Editors and Affiliations

  • Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, Columbus, USA

    Bharat Bhushan

  • Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Münster, Germany

    Harald Fuchs

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