Overview
- Nominated as an outstanding Ph.D. thesis by the Charles University in Prague, Czech Republic
- Introduces new 3D modelling of dislocations without recourse to tomography
- Validates the atomic force microscope as suitable tool for studying dislocations
- Includes supplementary material: sn.pub/extras
Part of the book series: Springer Theses (Springer Theses)
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Table of contents (6 chapters)
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms
Authors: Jozef Veselý
Series Title: Springer Theses
DOI: https://doi.org/10.1007/978-3-319-48302-3
Publisher: Springer Cham
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer International Publishing AG 2017
Hardcover ISBN: 978-3-319-48301-6Published: 21 December 2016
Softcover ISBN: 978-3-319-83910-3Published: 07 July 2018
eBook ISBN: 978-3-319-48302-3Published: 25 November 2016
Series ISSN: 2190-5053
Series E-ISSN: 2190-5061
Edition Number: 1
Number of Pages: XIV, 100
Number of Illustrations: 65 b/w illustrations, 21 illustrations in colour
Topics: Spectroscopy and Microscopy, Characterization and Evaluation of Materials, Condensed Matter Physics, Numerical and Computational Physics, Simulation