MEMS and Nanotechnology, Volume 6

1. Front Matter

   Pages i-viii

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2. Silicon Carbide High Temperature MEMS Capacitive Strain Sensor

   • R. P. Weisenberger, R. A. Coutu Jr., LaVern A. Starman

   Pages 1-9

3. Characterizing External Resistive, Inductive and Capacitive Loads for Micro-Switches

   • Benjamin Toler, Ronald Coutu Jr.

   Pages 11-18

4. Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules

   • Sithara S. Wijeratne, Nolan C. Harris, Ching-Hwa Kiang

   Pages 19-23

5. Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-Atom Chain Using Photon-Momentum-Based Force Calibration

   • Douglas T. Smith, J. R. Pratt

   Pages 25-29

6. A Precision Force Microscope for Biophysics

   • Gavin M. King, Allison B. Churnside, Thomas T. Perkins

   Pages 31-36

7. Hydrodynamic Force Compensation for Single-Molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy

   • Gordon A. Shaw

   Pages 37-40

8. New Insight into Pile-Up in Thin Film Indentation

   • Kevin Schwieker, James Frye, Barton C. Prorok

   Pages 41-46

9. Strain-Rate Sensitivity (SRS) of Nickel by Instrumented Indentation

   • Jennifer Hay, Verena Maier, Karsten Durst, Mathias Göken

   Pages 47-52

10. Frequency Multiplication and Demultiplication in MEMS

    • David B. Blocher, Alan T. Zehnder, Richard H. Rand

    Pages 53-58

11. Characterizing Metal Insulator Transition (MIT) Materials for Use as Micro-Switch Elements

    • Brent L. Danner, Ronald A. Coutu Jr.

    Pages 59-66

12. Stiction Failure in Microswitches Due to Elasto-Plastic Adhesive Contacts

    • Ling Wu, Jean-Claude Golinval, Ludovic Noels

    Pages 67-74

13. Simultaneous Measurement of Force and Conductance Across Single Molecule Junctions

    • Sriharsha V. Aradhya, Michael Frei, Mark S. Hybertsen, Latha Venkataraman

    Pages 75-84

14. High Speed Magnetic Tweezers at 10,000fps with Reflected Hg-Lamp Illumination

    • Bob M. Lansdorp, Omar A. Saleh

    Pages 85-91

15. Etching Silicon Dioxide for CNT Field Emission Device

    • Nathan E. Glauvitz, Ronald A. Coutu Jr., Peter J. Collins, LaVern A. Starman

    Pages 93-99

16. Modeling of Sheet Metals with Coarse Texture via Crystal Plasticity

    • Benjamin Klusemann, Alain Franz Knorr, Horst Vehoff, Bob Svendsen

    Pages 101-110

17. Evaluation of Mechanical Properties of Nano-structured Al6061 Synthesized Using Machining

    • Paresh S. Ghangrekar, H. Murthy, Balkrishna C. Rao

    Pages 111-118

18. Hardening Behaviour of Thin Wires Under Loading with Strain Gradients

    • Ying Chen, Mario Walter, Oliver Kraft

    Pages 119-124

19. Mapping the Histology of the Human Tympanic Membrane by Spatial Domain Optical Coherence Tomography

    • Corey Rutledge, Michael Thyden, Cosme Furlong, John J. Rosowski, Jeffery Tao Cheng

    Pages 125-129

20. Opto-Mechanical Characterization of a MEMS Sensor for Real-Time Infrared Imaging

    • Everett Tripp, Frank Pantuso, Lei Zhang, Ellery Harrington, Cosme Furlong

    Pages 131-134

MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics represents one of seven volumes of technical papers presented at the Society for Experimental Mechanics SEM 12th International Congress & Exposition on Experimental and Applied Mechanics, held at Costa Mesa, California, June 11-14, 2012. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Challenges in Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials, Imaging Methods for Novel Materials and Challenging Applications, Experimental and Applied Mechanics, Mechanics of Biological Systems and Materials and, Composite Materials and Joining Technologies for Composites.

• Devices & Fabrication
• Measurement Challenges
• Nanoindentation
• Optical Methods
• Residual Stress
• Single Molecule/Single Atom Mechanical Testing
• Size Effects in Metals
• Tribology

• NIST, Gaithersburg, USA

  Gordon A. Shaw

• Auburn University, Auburn, USA

  Barton C. Prorok

• Wright Patterson Air Force Base, USA

  LaVern A. Starman

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