Overview
- Focuses solely on the modeling of microscopy, not the instrumentation
- First book in the field since 1998
- Includes supplementary material: sn.pub/extras
Part of the book series: Nanostructure Science and Technology (NST)
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Table of contents (6 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Reviews
From the reviews:
“In six chapters, the editors tackle the ambitious challenge of bridging the gap between high-level applied mathematics and experimental electron microscopy. They have met the challenge admirably. … That work is also applicable to the new generation of x-ray free-electron lasers, which have similar prospective applications, and illustrates nicely the importance of applied mathematics in the physical sciences. Modeling Nanoscale Imaging in Electron Microscopy will be an important resource for graduate students and researchers in the area of high-resolution electron microscopy.” (Les J. Allen, Physics Today, Vol. 65 (5), May, 2012)
Editors and Affiliations
About the editors
Thomas Vogt is Director of the NanoCenter Educational Foundation and Distinguished Professor of Chemistry & Biochemistry at the University of South Carolina.
Wolfgang Dahmen is a professor at RWTH Aachen.
Peter G. Binev is a Professor of Mathematics at the University of South Carolina.
Bibliographic Information
Book Title: Modeling Nanoscale Imaging in Electron Microscopy
Editors: Thomas Vogt, Wolfgang Dahmen, Peter Binev
Series Title: Nanostructure Science and Technology
DOI: https://doi.org/10.1007/978-1-4614-2191-7
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer Science+Business Media, LLC 2012
Hardcover ISBN: 978-1-4614-2190-0Published: 02 March 2012
Softcover ISBN: 978-1-4899-9728-9Published: 13 April 2014
eBook ISBN: 978-1-4614-2191-7Published: 02 March 2012
Series ISSN: 1571-5744
Series E-ISSN: 2197-7976
Edition Number: 1
Number of Pages: IX, 182
Topics: Characterization and Evaluation of Materials, Analytical Chemistry, Nanotechnology, Theoretical and Computational Chemistry, Measurement Science and Instrumentation