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  • © 2011

Scanning Probe Microscopy of Functional Materials

Nanoscale Imaging and Spectroscopy

  • Serves the rapidly developing field of nanoscale characterization of functional materials properties

  • Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors

  • Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations

  • Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization

  • Includes supplementary material: sn.pub/extras

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Table of contents (18 chapters)

  1. Front Matter

    Pages i-xviii
  2. Dynamic Spectroscopic SPM

    1. Front Matter

      Pages 69-69
    2. Dynamic Force Microscopy and Spectroscopy in Ambient Conditions: Theory and Applications

      • Hendrik Hölscher, Jan-Erik Schmutz, Udo D. Schwarz
      Pages 71-94
    3. Multi-Frequency Atomic Force Microscopy

      • Roger Proksch
      Pages 125-151
  3. Thermal Characterization by SPM

    1. Front Matter

      Pages 179-179
    2. Dynamic SPM Methods for Local Analysis of Thermo-Mechanical Properties

      • M. P. Nikiforov, Roger Proksch
      Pages 199-229
  4. Electrical and Electromechanical SPM

    1. Front Matter

      Pages 231-231
    2. Polar Structures in Relaxors by Piezoresponse Force Microscopy

      • V. V. Shvartsman, W. Kleemann, D. A. Kiselev, I. K. Bdikin, A. L. Kholkin
      Pages 345-383
    3. Symmetries in Piezoresponse Force Microscopy

      • Andreas Ruediger
      Pages 385-402
  5. Novel SPM concepts

    1. Front Matter

      Pages 403-403
    2. New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy

      • Volker Rose, John W. Freeland, Stephen K. Streiffer
      Pages 405-431

About this book

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Editors and Affiliations

  • , NanoTransport Laboratory, Oak Ridge National Laboratory, Oak Ridge, USA

    Sergei V. Kalinin

  • Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, Lincoln, USA

    Alexei Gruverman

About the editors

Sergei Kalinin is a researcher at Oak Ridge National Laboratory. Alexei Gruverman is an associate professor at University of Nebraska-Lincoln.

Bibliographic Information

  • Book Title: Scanning Probe Microscopy of Functional Materials

  • Book Subtitle: Nanoscale Imaging and Spectroscopy

  • Editors: Sergei V. Kalinin, Alexei Gruverman

  • DOI: https://doi.org/10.1007/978-1-4419-7167-8

  • Publisher: Springer New York, NY

  • eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)

  • Copyright Information: Springer Science+Business Media, LLC 2011

  • Hardcover ISBN: 978-1-4419-6567-7Published: 10 December 2010

  • Softcover ISBN: 978-1-4939-3947-3Published: 23 August 2016

  • eBook ISBN: 978-1-4419-7167-8Published: 13 December 2010

  • Edition Number: 1

  • Number of Pages: XVIII, 555

  • Topics: Characterization and Evaluation of Materials

Buy it now

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access