Overview
- Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design Describes critical effects of process variation using simple examples that can be reproduced by the reader
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Table of contents (6 chapters)
Keywords
About this book
Editors and Affiliations
Bibliographic Information
Book Title: Process Variations and Probabilistic Integrated Circuit Design
Editors: Manfred Dietrich, Joachim Haase
DOI: https://doi.org/10.1007/978-1-4419-6621-6
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media, LLC 2012
Hardcover ISBN: 978-1-4419-6620-9
Softcover ISBN: 978-1-4899-8860-7
eBook ISBN: 978-1-4419-6621-6
Edition Number: 1
Number of Pages: XVI, 252
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design