Skip to main content
SpringerLink
Log in

Reliability Physics and Engineering

Time-To-Failure Modeling

  • Textbook
  • © 2010

Overview

Authors:
  1. J.W. McPherson

    1. IEEE Fellow, Plano, USA

    View author publications

    You can also search for this author in PubMed   Google Scholar

  • Provides basic Reliability Physics and Engineering tools for Electrical Engineers, Mechanical Engineers, Materials Scientists, and Applied Physicists to build better products
  • Includes information for the development of better methodologies for producing reliable product designs and materials selections
  • Contains statistical training and tools within the text
  • Emphasizes the physics of failure and the development of reliability engineering models for failure
  • Includes supplementary material: sn.pub/extras
  • Request lecturer material: sn.pub/lecturer-material

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 74.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (15 chapters)

  1. Front Matter

    Pages i-xiii
    Download chapter PDF

  2. Introduction

    • J.W. McPherson
    Pages 1-3

  3. Materials and Device Degradation

    • J.W. McPherson
    Pages 5-28

  4. From Material/Device Degradation to Time-To-Failure

    • J.W. McPherson
    Pages 29-35

  5. Time-To-Failure Modeling

    • J.W. McPherson
    Pages 37-50

  6. Gaussian Statistics — An Overview

    • J.W. McPherson
    Pages 51-61

  7. Time-To-Failure Statistics

    • J.W. McPherson
    Pages 63-77

  8. Failure Rate Modeling

    • J.W. McPherson
    Pages 79-93

  9. Accelerated Degradation

    • J.W. McPherson
    Pages 95-107

  10. Acceleration Factor Modeling

    • J.W. McPherson
    Pages 109-119

  11. Ramp-to-Failure Testing

    • J.W. McPherson
    Pages 121-136

  12. Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits

    • J.W. McPherson
    Pages 137-197

  13. Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering

    • J.W. McPherson
    Pages 199-272

  14. Conversion of Dynamical Stresses into Effective Static Values

    • J.W. McPherson
    Pages 273-298

  15. Increasing the Reliability of Device/Product Designs

    • J.W. McPherson
    Pages 299-310

  16. Erratum to: Materials and Device Degradation

    • J.W. McPherson
    Pages 310-311

  17. Back Matter

    Pages 311-318
    Download chapter PDF
Back to top

Keywords

About this book

All engineers could bene?t from at least one course in reliability physics and engineering. It is very likely that, starting with your very ?rst engineering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product last? The evidence for material/device degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. Doors in a new home can become stuck due to the shifting of the foundation. The new ?nish on an automobile will oxidize with time. The tight tolerances associated with ?nely meshed gears will deteriorate with time. Critical parameters associated with hi- precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakages, etc.) will degrade with time. In order to und- stand the lifetime of the material/device, it is important to understand the reliability physics (kinetics) for each of the potential failure mechanisms and then be able to develop the required reliability engineering methods that can be used to prevent, or at least minimize the occurrence of, device failure.

Authors and Affiliations

  • IEEE Fellow, Plano, USA

    J.W. McPherson

About the author

Dr. J.W. McPherson is a Texas Instruments Senior Fellow Emeritus and an IEEE Fellow. He has published approximately 200 papers on Reliability Physics and Engineering, written Reliability Chapters in four books, holds 12 patents and was a past General Chair of the International Reliability Physics Symposium. McPherson's broad reliability experience, with both electrical and mechanical failure mechanisms, makes him ideally suited to author a general textbook on Reliability Physics and Engineering.

Bibliographic Information

Publish with us

Policies and ethics

Back to top

Search

Navigation