Authors:
- Of great importance for the emerging nanotechnologies with their increasing numbers of transient faults
- Shows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designed
- The only book which describes the most important methods of concurrent checking developed in the last 15 years
- The only book which contains a detailed description of the best possible error detection circuits for all types of adders
- Shows for the first time how soft-error correction can be combined with concurrent checking
Part of the book series: Frontiers in Electronic Testing (FRET, volume 42)
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Table of contents (4 chapters)
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Universität Potsdam Inst. Informatik, Germany
Michael Göessel, Egor Sogomonyan, Daniel Marienfeld
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Infineo n Technologies AG, Germany
Vitaly Ocheretny
Bibliographic Information
Book Title: New Methods of Concurrent Checking
Authors: Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld
Series Title: Frontiers in Electronic Testing
DOI: https://doi.org/10.1007/978-1-4020-8420-1
Publisher: Springer Dordrecht
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer Science+Business Media B.V. 2008
Hardcover ISBN: 978-1-4020-8419-5Published: 09 May 2008
Softcover ISBN: 978-90-481-7876-6Published: 28 October 2010
eBook ISBN: 978-1-4020-8420-1Published: 26 April 2008
Series ISSN: 0929-1296
Edition Number: 1
Number of Pages: VIII, 182
Topics: Electrical Engineering, Circuits and Systems, Simulation and Modeling