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  • Book
  • © 2007

Design for Manufacturability and Yield for Nano-Scale CMOS

  • Addressing a new topic (DFM/DFY) critical at 90 nm and beyond
  • No book available today with comprehensive coverage of this topic
  • Book covers all CAD/CAE aspects of a SOC design flow

Part of the book series: Integrated Circuits and Systems (ICIR)

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eBook USD 84.99
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Softcover Book USD 109.99
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Hardcover Book USD 109.99
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Table of contents (8 chapters)

  1. Front Matter

    Pages I-XXVII
  2. Introduction

    • Charles C. Chiang, Jamil Kawa
    Pages 1-19
  3. Random Defects

    • Charles C. Chiang, Jamil Kawa
    Pages 21-51
  4. Systematic Yield - Lithography

    • Charles C. Chiang, Jamil Kawa
    Pages 53-97
  5. Systematic Yield - Chemical Mechanical Polishing (CMP)

    • Charles C. Chiang, Jamil Kawa
    Pages 99-150
  6. Variability & Parametric Yield

    • Charles C. Chiang, Jamil Kawa
    Pages 151-168
  7. Design for Yield

    • Charles C. Chiang, Jamil Kawa
    Pages 169-193
  8. Yield Prediction

    • Charles C. Chiang, Jamil Kawa
    Pages 195-226
  9. Conclusions

    • Charles C. Chiang, Jamil Kawa
    Pages 227-242
  10. Back Matter

    Pages 243-254

About this book

Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the design and layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, mask planning, simulation and manufacturing, and through statistical design and statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design’s manufacturability and yield. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Authors and Affiliations

  • Synopsys Inc., Mountain View, USA

    Charles C. Chiang, Jamil Kawa

About the authors

Dr. Charles Chiang is R&D Director of the Advanced Technology Group at Synopsys Inc. in Mountain View, CA, USA

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access