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Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

  • Conference proceedings
  • © 2004

Overview

Editors:
  1. Josef Sikula

    1. Brno University of Technology, Brno, Czech Republic

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  2. Michael Levinshtein

    1. Ioffe Institute of Russian Academy of Sciences, St. Petersburg, Russia

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Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 151)

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Table of contents (41 papers)

  1. Front Matter

    Pages I-IX
    Download chapter PDF

  2. Noise Sources

    1. 1/f Noise Sources

      • F.N. Hooge
      Pages 3-10

    2. Noise Sources in GaN/AlGaN Quantum Wells and Devices

      • S. Rumyantsev
      Pages 11-18

    3. 1/f Noise in Nanomaterials and Nanostructurea: Old Questions in a New Fashion

      • M. N. Mihaila
      Pages 19-27

    4. 1/f Spectra as a Consequence of the Randomness of Variance

      • G. Härtler
      Pages 29-36

    5. Quantum Phase Locking, 1/f Noise and Entanglement

      • M. Planat, H. Rosu
      Pages 37-44

    6. Shot Noise in Mesoscopic Devices and Quantum Dot Networks

      • M. Macucci, P. Marconcini, G. Iannaccone, M. Gattobigio, G. Basso, B. Pellegrini
      Pages 45-52

    7. Super-Poissonian Noise in Nanostructures

      • Ya. M. Blanter
      Pages 53-60

    8. Stochastic and Deterministic Models of Noise

      • J. Kumičák
      Pages 61-68

  3. Noise in Nanoscale Devices

    1. Noise in Optoelectronic Devices

      • R. Alabedra
      Pages 71-78

    2. Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers

      • S. Pralgauskaitė, V. Palenskis, J. Matukas
      Pages 79-88

    3. Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels

      • A. Matulionis
      Pages 89-96

    4. Noise of High Temperature Superconducting Bolometers

      • I.A. Khrebtov
      Pages 97-107

    5. 1/f Noise in MOSTs: Faster is Noisier

      • L.K.J. Vandamme
      Pages 109-120

    6. Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

      • E. Simoen, A. Mercha, C. Claeys
      Pages 121-128

    7. Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs

      • N. Lukyanchikova, E. Simoen, A. Mercha, C. Claeys
      Pages 129-136

    8. Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors

      • S. Ferraton, L. Montès, I. Ionica, J. Zimmermann, J. A. Chroboczek
      Pages 137-144

    9. Noise Modelling in Low Dimensional Electronic Structures

      • L. Reggiani, V. Ya Aleshkin, A. Reklaitis
      Pages 145-152

    10. Correlation Noise Measurements and Modeling of Nanoscale MOSFETs

      • J. Lee, G. Bosman
      Pages 153-160

    11. Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs

      • M. Levinshtein, S. Rumyantsev, M. S. Shur
      Pages 161-168
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Keywords

About this book

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

Editors and Affiliations

  • Brno University of Technology, Brno, Czech Republic

    Josef Sikula

  • Ioffe Institute of Russian Academy of Sciences, St. Petersburg, Russia

    Michael Levinshtein

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