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Defects in SiO2 and Related Dielectrics: Science and Technology

  • Book
  • © 2000

Overview

Editors:
  1. G. Pacchioni

    1. Dipartimento di Scienza dei Materiali, Università Milano-Bicocca, Milano, Italy

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  2. L. Skuja

    1. Institute of Solid State Physics, University of Latvia, Riga, Latvia

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  3. D. L. Griscom

    1. Naval Research Laboratory, USA

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Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry (NAII, volume 2)

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Table of contents (23 chapters)

  1. Front Matter

    Pages i-viii
    Download chapter PDF

  2. Structure and Topology

    1. Defect-Free Vitreous Networks: The Idealised Structure of SiO2 and Related Glasses

      • Adrian C. Wright
      Pages 1-35

    2. TOPOLOGY AND TOPOLOGICAL DISORDER IN SILICA

      • Linn W. Hobbs, Xianglong Yuan
      Pages 37-71

  3. Bulk Defects

    1. OPTICAL PROPERTIES OF DEFECTS IN SILICA

      • L. Skuja
      Pages 73-116

    2. THE NATURES OF POINT DEFECTS IN AMORPHOUS SILICON DIOXIDE

      • David L. Griscom
      Pages 117-159

    3. AB INITIO THEORY OF POINT DEFECTS IN SiO2

      • G. Pacchioni
      Pages 161-195

    4. A DEMI-CENTURY OF MAGNETIC DEFECTS IN a-QUARTZ

      • John A. Weil
      Pages 197-212

    5. INTERACTION OF SiO2 GLASSES WITH HIGH ENERGY ION BEAMS AND VACUUM UV EXCIMER LASER PULSES

      • Hideo Hosono, Ken-ichi Kawamura
      Pages 213-233

    6. EXCITONS, LOCALIZED STATES IN SILICON DIOXIDE AND RELATED CRYSTALS AND GLASSES

      • A. N. Trukhin
      Pages 235-283

    7. GAMMA RAYS INDUCED CONVERSION OF NATIVE DEFECTS IN NATURAL SILICA

      • F.M Gelardi, S. Agnello
      Pages 285-305

    8. GE AND SN DOPING IN SILICA: STRUCTURAL CHANGES, OPTICALLY ACTIVE DEFECTS, PARAMAGNETIC SITES

      • A. PALEARI
      Pages 307-327

    9. COMPUTATIONAL STUDIES OF SELF-TRAPPED EXCITONS IN SILICA

      • L. René Corrales, Jakyoung Song, Renée M. Vanginhoven, Hannes Jónsson
      Pages 329-337

  4. Surface Defects

    1. DEFECTS ON ACTIVATED SILICA SURFACE

      • V.A. RADZIG
      Pages 339-370

    2. AB-INITIO MOLECULAR DYNAMICS SIMULATION OF AMORPHOUS SILICA SURFACE

      • M. Bernasconi
      Pages 371-390

  5. Bragg Grating

    1. PERIODIC UV-INDUCED INDEX MODULATIONS IN DOPED-SILICA OPTICAL FIBERS: FORMATION AND PROPERTIES OF THE FIBER BRAGG GRATING

      • Charles G. Askins
      Pages 391-426

    2. BULK SILICAS PREPARED BY LOW PRESSURE PLASMA CVD: FORMATION OF STRUCTURE AND POINT DEFECTS

      • K. M. Golant
      Pages 427-452

    3. CHANGE OF SPECTROSCOPIC AND STRUCTURAL PROPERTIES OF GERMANOSILICATE GLASS UNDER MECHANICAL COMPRESSION AND UV IRRADIATION

      • V.M. Mashinsky
      Pages 453-470

    4. UV PHOTOINDUCED PHENOMENA IN OXIGEN-DEFICIENT SILICA GLASSES

      • A. Rybaltovskii
      Pages 471-497

    5. ONE- AND TWO-QUANTUM UV PHOTO-REACTIONS IN PURE AND DOPED SILICA GLASSES. 2. GERMANIUM OXYGEN DEFICIENT CENTERS (GODC).

      • V.N. Bagratashvili, S. I. Tsypina, P. V. Chernov, A.O. Rybaltovskii, Yu. S. Zavorotny
      Pages 499-514

    6. PHOTOINDUCED REFRACTIVE INDEX CHANGE AND SECOND HARMONIC GENERATION IN MCVD GERMANOSILICATE CORE FIBRES FABRICATED IN REDUCED (NITROGEN AND HELIUM) ATMOSPHERES

      • E.M. Dianov, A.N. Guryanov, V.F. Khopin, V.M. Mashinsky, O.I. Medvedkov, O.D. Sazhin et al.
      Pages 515-527
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Keywords

About this book

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Editors and Affiliations

  • Dipartimento di Scienza dei Materiali, Università Milano-Bicocca, Milano, Italy

    G. Pacchioni

  • Institute of Solid State Physics, University of Latvia, Riga, Latvia

    L. Skuja

  • Naval Research Laboratory, USA

    D. L. Griscom

Bibliographic Information

  • Book Title: Defects in SiO2 and Related Dielectrics: Science and Technology

  • Editors: G. Pacchioni, L. Skuja, D. L. Griscom

  • Series Title: NATO Science Series II: Mathematics, Physics and Chemistry

  • DOI: https://doi.org/10.1007/978-94-010-0944-7

  • Publisher: Springer Dordrecht

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media Dordrecht 2000

  • Hardcover ISBN: 978-0-7923-6685-0Published: 31 December 2000

  • Softcover ISBN: 978-0-7923-6686-7Published: 31 December 2000

  • eBook ISBN: 978-94-010-0944-7Published: 06 December 2012

  • Series ISSN: 1568-2609

  • Edition Number: 1

  • Number of Pages: VIII, 624

  • Number of Illustrations: 87 b/w illustrations

  • Topics: Characterization and Evaluation of Materials, Condensed Matter Physics

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