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Electron Backscatter Diffraction in Materials Science

  • Book
  • © 2009

Overview

Editors:
  1. Adam J. Schwartz

    1. Physical Sciences Directorate, Lawrence Livermore National Laboratory, Livermore, U.S.A.

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  2. Mukul Kumar

    1. Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, Livermore, U.S.A.

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  3. Brent L. Adams

    1. Dept. Mechanical Engineering, Brigham Young University, Provo, U.S.A.

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  4. David P. Field

    1. School of Mechanical &, Washington State University, Pullman, U.S.A.

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  • Brings together a collection of approximately 25 chapters written by experts in the field

  • Provides everything a researcher needs to enter and succeed in the field of electron backscatter diffraction

  • Includes a broad range of illustrative examples of the applications of electron backscatter diffraction to both materials science and condensed matter physics

  • Revised to reflect changes in the field in the past seven years, including an entirely new section on fundamentals and new material on current examples of applications

  • Includes supplementary material: sn.pub/extras

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Table of contents (27 chapters)

  1. Front Matter

    Pages i-xxii
    Download chapter PDF

  2. Present State of Electron Backscatter Diffraction and Prospective Developments

    • Robert A. Schwarzer, David P. Field, Brent L. Adams, Mukul Kumar, Adam J. Schwartz
    Pages 1-20

  3. Dynamical Simulation of Electron Backscatter Diffraction Patterns

    • Aimo Winkelmann
    Pages 21-33

  4. Representations of Texture

    • Jeremy K. Mason, Christopher A. Schuh
    Pages 35-51

  5. Energy Filtering in EBSD

    • Alwyn Eades, Andrew Deal, Abhishek Bhattacharyya, Tejpal Hooghan
    Pages 53-63

  6. Spherical Kikuchi Maps and Other Rarities

    • Austin P. Day
    Pages 65-80

  7. Phase Identification Through Symmetry Determination in EBSD Patterns

    • David J. Dingley, S.I. Wright
    Pages 97-107

  8. Application of Electron Backscatter Diffraction to Phase Identification

    • Bassem El-Dasher, Andrew Deal
    Pages 81-95

  9. Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping in a FIB-SEM

    • Stefan Zaefferer, Stuart I. Wright
    Pages 109-122

  10. Collection, Processing, and Analysis of Three-Dimensional EBSD Data Sets

    • Michael A. Groeber, David J. Rowenhorst, Michael D. Uchic
    Pages 123-137

  11. 3D Reconstruction of Digital Microstructures

    • Stephen D. Sintay, Michael A. Groeber, Anthony D. Rollett
    Pages 139-153

  12. Direct 3D Simulation of Plastic Flow from EBSD Data

    • Nathan R. Barton, Joel V. Bernier, Ricardo A. Lebensohn, Anthony D. Rollett
    Pages 155-167

  13. First-Order Microstructure Sensitive Design Based on Volume Fractions and Elementary Bounds

    • Surya R. Kalidindi, David T. Fullwood, Brent L. Adams
    Pages 169-175

  14. Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations

    • David T. Fullwood, Surya R. Kalidindi, Brent L. Adams
    Pages 177-188

  15. Combinatorial Materials Science and EBSD: A High Throughput Experimentation Tool

    • Krishna Rajan
    Pages 189-199

  16. Grain Boundary Networks

    • Bryan W. Reed, Christopher A. Schuh
    Pages 201-214

  17. Measurement of the Five-Parameter Grain Boundary Distribution from Planar Sections

    • Gregory S. Rohrer, Valerie Randle
    Pages 215-229

  18. Strain Mapping Using Electron Backscatter Diffraction

    • Angus J. Wilkinson, David J. Dingley, Graham Meaden
    Pages 231-249

  19. Mapping and Assessing Plastic Deformation Using EBSD

    • Luke N. Brewer, David P. Field, Colin C. Merriman
    Pages 251-262

  20. Analysis of Deformation Structures in FCC Materials Using EBSD and TEM Techniques

    • Oleg V. Mishin, Andrew Godfrey, Dorte Juul Jensen
    Pages 263-275
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Keywords

About this book

Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors.

The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.

Editors and Affiliations

  • Physical Sciences Directorate, Lawrence Livermore National Laboratory, Livermore, U.S.A.

    Adam J. Schwartz

  • Chemistry, Materials, Earth, & Life , Lawrence Livermore National Laboratory, Livermore, U.S.A.

    Mukul Kumar

  • Dept. Mechanical Engineering, Brigham Young University, Provo, U.S.A.

    Brent L. Adams

  • School of Mechanical &, Washington State University, Pullman, U.S.A.

    David P. Field

About the editors

Adam J. Schwartz is the Deputy Division Leader for Condensed Matter and High Pressure Physics in the Physics and Advanced Technologies Directorate. Dr. Schwartz joined LLNL as a post-doctoral research associate to investigate the systematics of displacive phase transformations after receiving his PhD from the University of Pittsburgh in 1991. His areas of interests focus on structure-propoerty-processing relations, aging and phase transformations in actinides; influence of microstructure and impurities on high-strain rate deformation behavior, texture and texture gradients in materials, intercrystalline defects and the role of grain boundary character distribution in materials, conventional and high resolution transmission electron microscopy, and electron backscatter diffraction. Dr. Schwartz has authored over 50 publications and has one patent.

Mukul Kumar joined as a staff scientist in the Materials Science and Technology Division in 1998 after completing a stint as a post-doctoral fellow at Johns Hopkins University. Prior to that, he received his PhD from the University of Cincinnati, where he was an Oak Ridge Institute for Science and Engineering Fellow and also received the ASM International Arthur Focke Award for his dissertation work. His areas of interest include the relationship between properties and microstructures, particularly as related to extreme environments encountered in turbine jet engine and nuclear reactor environments and high strain rate and pressure conditions; defect analysis using conventional transmission electron microscopy; and electron backscatter diffraction. Kumar has authored over 70 publications and has two patents.

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