Overview
- Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
- Provides a framework for linking scanning probe theory and simulations with experimental data
- Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
Part of the book series: NanoScience and Technology (NANO)
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Table of contents (10 chapters)
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Front Matter
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Back Matter
Keywords
About this book
Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.
Key Features
- Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy
- Provides a framework for linking scanning probe theory and simulations with experimental data
- Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations
Authors and Affiliations
Bibliographic Information
Book Title: Scanning Probe Microscopy
Book Subtitle: Atomic Scale Engineering by Forces and Currents
Authors: Adam Foster, Werner Hofer
Series Title: NanoScience and Technology
DOI: https://doi.org/10.1007/0-387-37231-8
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag New York 2006
Hardcover ISBN: 978-0-387-40090-7Published: 28 June 2006
Softcover ISBN: 978-1-4419-2306-6Published: 23 November 2010
eBook ISBN: 978-0-387-37231-0Published: 14 October 2006
Series ISSN: 1434-4904
Series E-ISSN: 2197-7127
Edition Number: 1
Number of Pages: XIV, 282
Topics: Characterization and Evaluation of Materials, Nanotechnology, Surfaces and Interfaces, Thin Films, Atomic/Molecular Structure and Spectra, Solid State Physics, Spectroscopy and Microscopy