Overview
- Presents SEM fundamentals and applications for nanotechnology
- Includes integrated fabrication techniques using the SEM, such as e-beam and FIB
- Covers in-situ nanomanipulation of materials
- Written by international experts from the top nano-research groups that specialize in nanomaterials characterization
- Includes supplementary material: sn.pub/extras
Access this book
Tax calculation will be finalised at checkout
Other ways to access
Table of contents (15 chapters)
-
Front Matter
-
Back Matter
Keywords
About this book
Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Editors and Affiliations
Bibliographic Information
Book Title: Scanning Microscopy for Nanotechnology
Book Subtitle: Techniques and Applications
Editors: Weilie Zhou, Zhong Lin Wang
DOI: https://doi.org/10.1007/978-0-387-39620-0
Publisher: Springer New York, NY
eBook Packages: Chemistry and Materials Science, Chemistry and Material Science (R0)
Copyright Information: Springer-Verlag New York 2007
Hardcover ISBN: 978-0-387-33325-0
Softcover ISBN: 978-1-4419-2209-0
eBook ISBN: 978-0-387-39620-0
Edition Number: 1
Number of Pages: XIV, 522
Number of Illustrations: 399 b/w illustrations
Topics: Nanotechnology, Characterization and Evaluation of Materials, Optical and Electronic Materials, Measurement Science and Instrumentation