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  • © 2005

Physical Principles of Electron Microscopy

An Introduction to TEM, SEM, and AEM

Authors:

  • Introduces the theory and current practice of electron microscopy

  • Ideal for undergraduates and technologists with limited mathematical training

  • Covers principles and techniques essential to materials science, the semiconductor industry, nanotechnology, and the biomedical and forensic sciences

  • Leading author who received the Distinguished Physical Scientist Award of the Microscopical Society of America in 2004

  • Includes supplementary material: sn.pub/extras

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Table of contents (7 chapters)

  1. Front Matter

    Pages i-xii
  2. An Introduction to Microscopy

    • Ray F. Egerton
    Pages 1-25
  3. Electron Optics

    • Ray F. Egerton
    Pages 27-55
  4. The Transmission Electron Microscope

    • Ray F. Egerton
    Pages 57-92
  5. TEM Specimens and Images

    • Ray F. Egerton
    Pages 93-124
  6. The Scanning Electron Microscope

    • Ray F. Egerton
    Pages 125-153
  7. Analytical Electron Microscopy

    • Ray F. Egerton
    Pages 155-175
  8. Recent Developments

    • Ray F. Egerton
    Pages 177-189
  9. Back Matter

    Pages 191-202

About this book

Scanning and stationary-beam electron microscopes have become an indespensible tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and "inner space." However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited mathematical training.

Reviews

From the reviews:

"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques … . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole … . The text includes interesting historical tidbits and also alludes to more recent developments … . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)

"R.F. Egerton … has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. … Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

Authors and Affiliations

  • Department of Physics, University of Alberta, Edmonton, Canada

    Ray F. Egerton

Bibliographic Information

Buy it now

Buying options

eBook USD 139.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book USD 179.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access