Skip to main content
Log in

Overview

Journal of Electronic Testing is among the journals recognized for Editorial Excellence. Editor-in-Chief Dr. Vishwani Agrawal performed in the top 10% of qualifying journals* based on data collected from the Journal Author Satisfaction survey. Click here for more information: https://www.springernature.com/gp/editors/campaigns/editorial-excellence


The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes: testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

Main Editor
  • Vishwani Agrawal
Impact factor
0.9 (2022)
5 year impact factor
1.0 (2022)
Submission to first decision (median)
27 days
Downloads
77,166 (2023)

Latest articles

  1. Editorial

    • Vishwani D. Agrawal
    EditorialNotes 14 March 2024

Journal updates

Journal information

Electronic ISSN
1573-0727
Print ISSN
0923-8174
Abstracted and indexed in
  1. ACM Digital Library
  2. BFI List
  3. Baidu
  4. CLOCKSS
  5. CNKI
  6. CNPIEC
  7. Current Contents/Electronics & Telecommunications Collection
  8. Current Contents/Engineering, Computing and Technology
  9. DBLP
  10. Dimensions
  11. EBSCO
  12. EI Compendex
  13. Google Scholar
  14. INIS Atomindex
  15. INSPEC
  16. Japanese Science and Technology Agency (JST)
  17. Naver
  18. Norwegian Register for Scientific Journals and Series
  19. OCLC WorldCat Discovery Service
  20. Portico
  21. ProQuest
  22. SCImago
  23. SCOPUS
  24. Science Citation Index Expanded (SCIE)
  25. TD Net Discovery Service
  26. UGC-CARE List (India)
  27. Wanfang
Copyright information

Rights and permissions

Springer policies

© Springer Science+Business Media, LLC, part of Springer Nature

Navigation